Kuznetsov П. Л.; Kuznetsova В. А.; Muravyev В. В. Investigation of Tantalum Capacitors Using the Accelerated Quality Assessment Technique STRESS TEST. Intellekt. Sist. Proizv., [S. l.], v. 19, n. 4, p. 49–54, 2021. DOI: 10.22213/2410-9304-2021-4-49-54. Disponível em: https://izdat.istu.ru/index.php/ISM/article/view/4770. Acesso em: 18 may. 2024.