Ushakov ПА, Maksimov КО, Dedyukhin АА. Research of ADG4XX Series Integrated Microcircuits Radiation Hardness Regarding Total Ionizing Dose Ef-fects. Вестн. Ижевск. гос. тех. унив. [Internet]. 2019 Dec. 30 [cited 2024 Jul. 3];22(4):73-82. Available from: https://izdat.istu.ru/index.php/vestnik/article/view/4430