Influence of parameters of pulse testing stand on results of testing

Authors

  • B. I. Sibgatullin Kalashnikov Izhevsk State Technical University
  • V. K. Barsukov Kalashnikov Izhevsk State Technical University

Keywords:

tantalum chip condenser, pulse current testing, transient processes

Abstract

The mathematical model describing the transient processes arising in pulse testing is developed. Influence of parameters of pulse testing stand on testing results is analyzed. Conclusions are made, tasks of further investigations are assigned.

Author Biographies

B. I. Sibgatullin, Kalashnikov Izhevsk State Technical University

Post-graduate

V. K. Barsukov, Kalashnikov Izhevsk State Technical University

PhD in Engineering, Professor

References

Соломин А. В. Разработка стенда для тестирования танталовых чип-конденсаторов импульсным током : дис. … магистра. – Ижевск, 2013. – 73 с.

ESA/SCC Generic Specification № 3012.

MIL-PRF-55365G, 2008.

Teverovsky A. Effect of inductance and requirements for surge current testing of tantalum capacitors // CARTS-CONFERENCE-. – COMPONENTS TECHNOLOGY INSTITUTE INC., 2006. – Т. 26. – С. 363.

Holland H. W. Effects of High Сurrent Transients on Sol-id Tantalum Capacitors //Electronic Equipment News (March, 1976) pp. – 1976. – С. 20–21.

Teverovsky A. Op. cit.

Бессонов Л. А. Теоретические основы электротехники. – М. : Высш. шк., 1996. – 623 с. : ил.

Holland H. W. Op. cit.

Reed E. K. and Paulsen J. L. Impact of circuit resistance on the breakdown voltage of tantalum chip capacitors, in Pro-ceedings of the CARTS, 2001. P. 150–156.

Ibid.

Gill J. Surge in solid tantalum capacitors // AVX (July, 1994). – 1995.

Reed E. K. and Paulsen J. L. Op. cit.

Teverovsky A. Op. cit.

Ibid.

Ibid.

Ibid.

Ibid.

Published

25.12.2014

How to Cite

Sibgatullin Б. И., & Barsukov В. К. (2014). Influence of parameters of pulse testing stand on results of testing. Intellekt. Sist. Proizv., 2(2), 195–202. Retrieved from https://izdat.istu.ru/index.php/ISM/article/view/1899

Issue

Section

Energy engineering (only archive)