Testing of Digital Microcircuits and Programming of Bench Equipment "Formula 2k" for Measuring Parameters

Authors

  • A. N. Kopysov Kalashnikov ISTU
  • R. A. Khatbullin Kalashnikov ISTU
  • V. V. Khvorenkov Kalashnikov ISTU
  • F. M. Ermakov Kalashnikov ISTU
  • K. A. Zyryanov Kalashnikov ISTU

DOI:

https://doi.org/10.22213/2410-9304-2017-4-29-34

Keywords:

AltiumDesigner, Formula 2k, Sinop, adapter plate, testing of microcircuits, contacting device, Altium Designer

Abstract

One of the ways of digital microcircuit testing is studied, namely: testing by means of the “Formula 2k” bench equipment. Testing allows for improving the quality of the output due to the rejection of low-quality elements, that is why, the consumer is interested in testing. The testing of microcircuits solves the following task: preparation of design documentation, development of software for equipment testing and its debugging. The source material for it is the microcircuit technical documentation. The most important parameters are chosen according to the documentation. These parameters allow to estimate the quality of the microcircuit during its testing. A printed circuit board is created based on these parameters. During the preparation for testing, the software is used to create a transition board. The design documentation for the board is developed on the basis of the Altium Designer software package. A special contact device is used to connect the microcircuit to the adapter board. It is also created in the Altium Designer according to its device schematics. The contacting device connects the microcircuit pins with the pads on the adapter board. Parameter tolerances required for the measurement are determined according to the specifications and datasheet for the tested microcircuit. The software is developed in the programming language “Sinop” using this datasheet. The tester is configured to carry out the measurements. The output data of the measured parameters is generated after completion of debugging and measurements. If all of the measured parameters are consistent to the declared ones, microcircuit is considered to pass control, otherwise it is rejected.

Author Biographies

A. N. Kopysov, Kalashnikov ISTU

PhD in Engineering, Associated Professor

R. A. Khatbullin, Kalashnikov ISTU

PhD in Engineering, Associated Professor

V. V. Khvorenkov, Kalashnikov ISTU

DSc in Engineering, Professor

F. M. Ermakov, Kalashnikov ISTU

Student

K. A. Zyryanov, Kalashnikov ISTU

Student

References

Сабунин А. Е. Altium Designer. Новые решения в проектировании электронных устройств. М. : Солон-пресс, 2009. 432 c.

Система контрольно-измерительная для контроля БИС и ИМС // Тестер FORMULA 2K Руководство по эксплуатации ФОРМ, редакция 14.

Тестирование цифровых микросхем и подготовка стендового оборудования для измерения параметров / Ф. М. Ермаков, К. А. Зырянов, А. Н. Копысов, Р. А. Хатбуллин, К. А. Мерзляков // Приборостроение в XXI веке - 2016. Интеграция науки, образования и производства. Ижевск, 2016. С. 476-483.

Published

25.12.2017

How to Cite

Kopysov А. Н., Khatbullin Р. А., Khvorenkov В. В., Ermakov Ф. М., & Zyryanov К. А. (2017). Testing of Digital Microcircuits and Programming of Bench Equipment "Formula 2k" for Measuring Parameters. Intellekt. Sist. Proizv., 15(4), 29–34. https://doi.org/10.22213/2410-9304-2017-4-29-34

Issue

Section

Articles