Quality Control of Tantalum Capacitors Based on the Analysis of Defects Appearing in the Production and Detected in Operation Process

Abstract

For assessment of tantalum capacitors reliability level and for well-time correction actions during production the method of tantalum capacitors quality control based on the analysis of defects appearing in the production and detected in operation process was investigated; and it should be subject to full approbation. The model is based on research of kinds and consequences of probable defects that may appear in production process or during periodic (qualification, typical) tests or in any operation processes made by a consumer (incoming inspection, tests, operation, etc.). For more objective assessment and making a decision on necessity and reasonability of improving the item and meeting the consumer requirements made to capacitors, the investigation objects are all rejected items independently on the reasons of their defectiveness: the consumer or the manufacturer fault. The proposed model allows for controlling the quality of tantalum capacitors basing on the types and consequences of potential defects appearing at manufacturing stages and detected in operation. The primary approbation of the system statistic analysis of tantalum capacitors quality is given in the paper.