Mathematical Model of Dependence of Electrical Measuring Device Accuracyon Temperature Effects: Experimental Research and Modeling

Abstract

Product or service quality assessment is a complex task in terms of data collection and processing. For electrical test and measurement devices, one of the key parameters affecting the operating quality is the influence of external conditions, one of which is the ambient temperature. Since measurement device is a complex structural product, the effect of temperature has to be evaluated comprehensively on the entire electrical data display mechanism. The key objective of this study is to construct a mathematical model that characterizes the short-term effects of external temperature exposure on the overall design, operation, and quality of an electrical instrumentation device. The model presented in the study considers the change in the internal resistances of the instrument, the change in the magnetic induction and the characteristic rebuilding dynamics of the return mechanism spring of the arrow-analog measurement devices. According to the model results, the diagrams of temperature effect on the errors of electrical measurements were presented. It was determined that when operating in the boundary modes, values close to the normalizing one exceed the device allowable error. The presented model is proposed to be used as a tool for evaluation, tracking and correction of electrical instrumentation deviations, as well as for more precise determination of the measurement device quality level subjected to temperature effects. The results of the model have an objective quantitative assessment for qualification and adjustment of the verification interval. According to measurements of temperature modes and basic parameters of the investigated electrical instrumentation, it is possible to perform modeling and evaluate further temperature effect on the final accuracy of the device.